Joseph I.Goldstein.<br/>
                  Scanning electron Microscopy and X-Ray microanalysis. 

 - 4-th edition  
 -  Springer  2018 
<br/><br/><br/>English 
<br/><br/>                 <label>Түлхүүр үг: </label>Electron beam, Backscattered & secondary electrons, X-Rays, Scanning, Image formation, 
<br/><br/><label>Subjects--Geographic Terms: </label><br/>Analysis of speciments with special geometry