TY  - BOOK
AU  - Joseph I.Goldstein.
TI  - Scanning electron Microscopy and X-Ray microanalysis
PY  - 2018///
PB  - Springer
KW  - Electron beam, Backscattered & secondary electrons, X-Rays, Scanning, Image formation
KW  - Analysis of speciments with special geometry
UR  - https://online.fliphtml5.com/lluzx/jfrq/
ER  -